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Camera-induced broadening of infrared spectral lines recorded using Ebert-type spectrometer

JOURNAL OF INSTRUMENTATION(2018)

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摘要
Extensive broadening of Ne I and Kr I spectral lines in infrared region, recorded by means of back-thinned CCD camera and Ebert-type spectrometer is studied. The results indicate that physical processes inside the CCD camera are responsible for alteration of the instrumental profile in infrared region, regardless of used source of radiation. The fitting procedure, including single pseudo-Voigt and superposition of two Lorentzian functions is suggested. The wavelength dependence of fitting parameters is described by second order polynomial curves, which may serve for revealing the instrumental profile shape at required wavelength.
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Detectors for UV, visible and IR photons,Plasma diagnostics - interferometry, spectroscopy and imaging,Data analysis
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