Characterization of Noisy EM Fields by Cross Spectral Density Eigenvalue Analysis

In this paper we present a method for analyzing stochastic electromagnetic field distributions on basis of eigenvalue analysis of the cross spectral density (CSD) matrix. The method returns information about the stochastic process, e.g. number and strength of statistically independent sources. These are important details for generating properly correlated noisy fields, so the method is especially useful if CSD measurement results are subject to reproduction in electromagnetic (EM) simulations.