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Correlation between the structural transformations and physical properties in Ge 2 Sb 2 Te 5 thin films

A. A. Sherchenkov,P. I. Lazarenko,Yuliya S. Sybina,Alexander S. Prikhodko,Alexey Yakubov

ieee conference of russian young researchers in electrical and electronic engineering（2017）

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Key words
phase change memory, thin films, Ge2Sb2Te5, phase transformations, electrical properties, structure characteristics
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