Reliability Study of Carbon Nanotube Memory after Various Cycling Conditions

Takashi Inose,Tomoko Ogura Iwasaki,Sheyang Ning,Darlene Viviani,Monte Manning,X. M. Henry Huang,Thomas Rueckes,Ken Takeuchi

IEEE Silicon Nanoelectronics Workshop（2016）

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关键词

carbon nanotube memory,CNT memory,cycling conditions,low voltage,low current switching mechanism,reset algorithms,CNT reliability,endurance cycles,reset endurance voltages,reset cycling voltages,reset errors

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