Characteristics Testing of One-Shot Switch

Hu Bo,Xu Cong, Zhu Peng,Ye Yinghua,Shen Ruiqi

2016 China Semiconductor Technology International Conference (CSTIC)（2016）

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摘要

The characteristics of one-shot switch for the exploding foil initiators system (EFIS) are researched. The switch is fabricated based on micro-fabrication. The palsma temperature of the switching process is analyzed by using the method of the atomic emission spectroscopy double line technique. The shock pressure of Schottky Barrier Diode (SBD) electro-explosive is tested by Polyvinylidene Fluoride (PVDF) film. The problem of ablation on PVDF during testing is solved by using PMMA. The measured peak shock pressure is in MPa magnitude.

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关键词

one-shot switch,exploding foil initiators system,EFIS,microfabrication,palsma temperature,switching process,atomic emission spectroscopy double line technique,shock pressure,Schottky barrier diode,SBD electroexplosive,polyvinylidene fluoride film,PVDF film,PMMA

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