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Thirty Per Cent Contrast in Secondary-Electron Imaging by Scanning Field-Emission Microscopy

D. A. Zanin,L. G. De Pietro,Q. Peter,A. Kostanyan,H. Cabrera,A. Vindigni, Th. Bahler,D. Pescia,U. Ramsperger

Proceedings of the Royal Society A Mathematical Physical and Engineering Sciences（2016）

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关键词
scanning tunnelling microscopy,secondary-electron imaging,scanning field-electron microscopy,scanning field-emission microscopy
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