Advanced Test Methodology for Complex SoCs

Pavan Kumar Datla Jagannadha,Mahmut Yilmaz,Milind Sonawane,Sailendra Chadalavada,Shantanu Sarangi,Bonita Bhaskaran,Ayub Abdollahian

International Test Conference（2016）

引用 13|浏览44
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关键词
concurrent testing,low power test,multi-site testing,pattern reuse,low pin count test,sequential compression
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