Waveform Design Based Multi-Target Hypothesis Testing under Unknown Clutter Parameters

A method to solve multi-target classification problems with unknown clutter parameters is proposed in this paper. The unknown parameter is estimated and synthesized at each observation, and probability of each hypothesis is updated. Subsequently, the optimal waveform for the next illumination is designed based on NP criteria, and the final decision is made based on the sequential probability ratio testing. Simulated results are presented based on our method and show that the optimal waveform-based sequential testing can be decided through reduction of the average illumination number. Furthermore, results indicate a significant improvement over the non-optimal waveforms.