Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs

•The effects of AEP-LDPC are investigated in a 2×nm TLC NAND Flash memory.•Compared with conventional BCH, data-retention time is extended by 12×.•AEP-LDPC can correct errors with pre-determined tables made at higher temperature.•It is found that one table can cover behavior over a range of temperatures.•The total table size can be reduced, which makes this approach more practical.