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Improvement of Automatic Scaling of Vertical Incidence Ionograms by Simulated Annealing

Journal of Atmospheric and Solar-Terrestrial Physics(2015)SCI 4区

Wuhan Univ

Cited 20|Views14
Abstract
The ionogram autoscaling technique is very important for facilitating the statistical investigation of the ionosphere. Jiang et al. (2013) proposed an autoscaling technique for extracting ionospheric characteristics from vertical incidence ionograms. However, extensive efforts are invested in continuously improving the performance of that. The simulated annealing (SA) is used to improve the autoscaling technique in this paper. To be capable of automatic scaling of ionograms recorded at different locations, the SA is applied instead of Empirical Orthogonal Functions (EOFs) to search the best-fit parameters in the autoscaling technique. In order to validate the improvement of this autoscaling technique, ionograms recorded at Wuhan (30.5°N, 114.3°E), Puer (22.7°N, 101.05°E) and Leshan (29.6°N, 103.75°E) are investigated by comparing the autoscaled results with the values scaled by an operator. Results show that the presented work is efficient for scaling of ionograms recorded at different geographic positions. Moreover, the additional procedure can improve the accuracy of the autoscaling technique compared to results presented by Jiang et al. (2013).
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Key words
Ionogram,Automatic scaling,Simulated annealing,Ionosphere
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要点】:本文使用模拟退火(Simulated Annealing, SA)算法改进垂直入射电离层图自动缩放技术,提高了不同地理位置记录的电离层图的缩放精度和效率。

方法】:作者采用模拟退火算法替代经验正交函数(Empirical Orthogonal Functions, EOFs)来搜索自动缩放技术的最佳拟合参数。

实验】:通过对比武汉、普洱和乐山三地的电离层图自动缩放结果与人工缩放值,验证了改进后的技术在不同地理位置的有效性,并显示缩放准确性相比Jiang等人2013年的结果有所提高。实验使用的数据集为记录在上述三地的电离层图。