Interfacial Free Energies Determined from Binary Embedded Alloy Nanocluster Geometry

C. N. Boswell-Koller,S. J. Shin,J. Guzman,M. P. Sherburne,K. C. Bustillo,C. A. Sawyer,J. P. Mastandrea,J. W. Beeman,J. W. Ager,E. E. Haller,D. C. Chrzan

APL materials（2013）

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摘要

The equilibrium geometries of embedded binary eutectic alloy nanostructures are used to determine the interfacial free energies between two phases of a strongly segregating alloy and the matrix. The solid Ge-SiO2 interfacial free energy at 600°C is determined to be 0.82–0.99 J/m2, in good agreement with estimates obtained from stress relaxation experiments.

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