Enhanced confinement of sensitive materials of a high-K metal gate electrode structureJan Hoentschel,Sven Beyer,Thilo Scheiper,Uwe Griebenowmag(2014)引用 24|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要