The Dynamic Stress Measurement System
ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings（2005）
摘要
In the device properties; the dynamic stress' is a critical parameter This paper puts forward a new measurement system of the dynamic stress using the Raman spectroscopy and the high frequency modulation. It proves that the measurement system has the characteristic of the delicacy, stability and repetition by experiment.
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