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Radiation-Induced Charge Transfer Inefficiency in Charge-Coupled Devices: Sentinel-4 Ccd Pre-Development As A Case Study

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE(2014)

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摘要
Energetic particles in space damage electronic components, and in particular affect the capability of Charge-Coupled Devices (CCD) to transfer photo-generated charge packets to the output node. If not properly accounted for either during the instrument design process or in the mission data processing pipeline, radiation-induced Charge Transfer Inefficiency (CTI) causes image distortion, decreases the signal-to-noise ratio, and ultimately leads to bias in the measurement carried out. CTI is a well-identified error budget contributor for mission operating in the photon-starving regime like space telescopes dedicated to Astronomy, but is less studied in the context of Earth Observation missions. We present a study conducted during the Sentinel-4/UVN CCD pre-development to provide a first assessment of the CTI effects on the Sentinel-4 measurements.
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关键词
CCD,Radiation damage,CTI,Bulk traps,Sentinel 4,Copernicus programme
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