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Structural Properties of BaTiO[sub 3]∕zno Heterostructures and Interfaces

AIP conference proceedings(2011)

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摘要
We report on the investigation of the structural properties of BaTiO3(BTO)/ZnO heterostructures grown by pulsed laser deposition (PLD). Special emphasis is devoted to the growth properties of BTO on ZnO and the BTO/ZnO interface. X-ray diffraction (XRD) measurements of thick BTO layers reveal well (100)-oriented BTO films. Sensitive UV-excited Raman measurements of very thin BTO films on (00.1) ZnO reveal the possible presence of a hexagonal BTO phase close to the interface, in addition to the dominating tetragonal BTO phase.
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关键词
BaTiO3,ZnO,XRD,Raman-Spectroscopy
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