In-Situ Scanning Electron Microscopy Study Of Fracture Events During Back-End-Of-Line Microbeam Bending TestsKris Vanstreels,I De Wolf,Houman Zahedmanesh,H Bender,Mireia Bargallo Gonzalez,J Lefebvre,S BhowmickAPPLIED PHYSICS LETTERS（2014）引用 16|浏览2暂无评分关键词Nanoscale FrictionAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
