Development of LC-type ESD/EMI filter based on TVS devices for peripheral device applications

Daoheung Bouangeune,Woongki Hong,Sangsik Choi,Cheljong Choi,Deokho Cho,Kyuhwan Shim,Younggi Kim

Consumer Electronics（2012）

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摘要

A fully integrated LC-type ESD/EMI filter was developed by the integrated passive devices (IPD) technology. Unique TVS diodes are employed to enhance its performance while maintaining robust ESD characteristics. The reliability and performance of ESD/EMI filter are confirmed based on both attenuation and electrostatic discharge (ESD) strength which could be evaluated by insertion loss (S parameter), ESD and transmission line pulse (TLP) testing method. As the results, the device shows very low leakage current less than 1nA. Its ESD protection and attenuation could be robustness exceed 28 A TLP and ±17 kV IEC 61000-4-2 and achieved as >;35 dB at 800 MHz ~3 GHz, respectively. The cut off frequency obtained of 160 MHz that can ensure high-speed data communication applications.

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关键词

lc circuits,s-parameters,electromagnetic interference,electrostatic discharge,integrated circuit reliability,leakage currents,low-pass filters,passive filters,esd protection,esd strength,ipd technology,s parameter,tlp testing method,tvs devices,tvs diodes,attenuation,electrostatic discharge strength,frequency 160 mhz,frequency 800 mhz to 3 ghz,fully-integrated lc-type esd-emi filter reliability,high-speed data communication application,insertion loss,integrated passive devices,leakage current,peripheral device application,robust esd characteristics,transmission line pulse,emi,esd,filter,s-parameter,tlp,tvs,s parameters,low pass filters

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