Field Effect Diode for Effective CDM ESD Protection in 45 Nm SOI Technology
IEEE International Reliability Physics Symposium proceedings（2009）
Key words
semiconductor reliability,electrostatic discharge (ESD),charged device model (CDM),Silicon-on-Insulator (SOI),silicon-controlled rectifier (SCR),field-effect diode (FED),transient effect,local clamping
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined