A Portable System for Monolithic Active Pixel Sensors Characterization

G Claus,A Besson,G Deptuch,M Deveaux,W Dulinski,G Gaycken,D Grandjean,A Himmi,K Jaaskelainen,P Jalocha, M Pellicioli,M Winter

IEEE Symposium Conference Record Nuclear Science 2004（2005）

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摘要

A portable system for monolithic active pixel sensors characterization has been developed, its main feature is flexibility. This system can be used for all prototypes test stages, from functional test on wafer to tracking performance measurement with our beam telescope. It is built around a VME data acquisition system and ADC boards 12-bit 20 MHz. System control GUI, on-line monitoring, and data storage tasks are handled by a remote PC. A transparent access to raw data is provided which allows easy interface to both off-line and on-line analysis software. In order to increase system integration, a new generation of ADC board 14-bit 100 MHz, based on USB 2.0 bus, has been designed and tested. It will allow on-board data processing algorithm implementation in a Virtex II FPGA target.

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关键词

position sensitive particle detectors,semiconductor counters,ADC boards,VME data acquisition system,Virtex II FPGA target,beam telescope,data storage tasks,functional test,monolithic active pixel sensors characterization,off-line analysis software,on-board data processing algorithm implementation,on-line analysis software,on-line monitoring,portable system,prototypes test stages,remote PC,system control GUI,system integration,tracking performance measurement,transparent raw data access,wafer

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