Extending fault periodicity table for testing faults in memories under 20nm
Design & Test Symposium（2014）
关键词
mosfet circuits,built-in self test,integrated circuit reliability,integrated circuit testing,storage management chips,fpt,finfet-based memories,fault periodicity table,fault sensitization complexity,fault testing,memory bist infrastructure,memory faults,size 14 nm,size 16 nm,size 20 nm,test algorithms,finfet,march test,built-in self-test,fault periodicity,logic gates
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