A Test Generator for Segment Delay Faults
VLSI Design（1999）
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line m,reasonable robust segment delay,benchmark circuit,small segment length,segment delay faults,transition fault coverage,delay fault,large number,path delay fault,test generator,testable segment fault,segment delay fault model,fitness function,fault model,upper bound,atpg,fault detection,test coverage,objective function,automatic test pattern generation,computational modeling,robustness,benchmark testing,fault coverage,genetic algorithm,genetic algorithms
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