128Gb 3b/cell NAND flash memory in 19nm technology with 18MB/s write rate and 400Mb/s toggle mode.

Yan Li,Seungpil Lee,Ken Oowada,Hao Nguyen,Qui Nguyen,Nima Mokhlesi,Cynthia Hsu,Jason Li,Venky Ramachandra,Teruhiko Kamei,Masaaki Higashitani,Tuan Pham,Mitsuaki Honma,Yoshihisa Watanabe,Kazumi Ino,Binh Le,Byungki Woo,Khin Htoo,Taiyuan Tseng,Long Pham,Frank Tsai,Kwang-ho Kim, Yi-Chieh Chen,Min She,Jonghak Yuh,Alex Chu,Chen Chen,Ruchi Puri,Hung-Szu Lin, Yi-Fang Chen,William Mak,Jonathan Huynh,Jim Chan,Mitsuyuki Watanabe, Daniel Yang,Grishma Shah,Pavithra Souriraj,Dinesh Tadepalli,Tenugu Suman,Ray Gao,Viski Popuri,Behdad Azarbayjani,Ravindra Madpur,James Lan,Emilio Yero,Feng Pan,Patrick Hong,Jang Yong Kang,Farookh Moogat,Yupin Fong,Raul Cernea,Sharon Huynh,Cuong Trinh,Mehrdad Mofidi,Ritu Shrivastava,Khandker Quader

ISSCC（2012）

Cited 52|Views43
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Key words
layout,temperature measurement,computer architecture,temperature,chip,couplings
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