Modelling of the defect structure in GaN MOCVD thin films by X-ray diffraction
Materials Science and Engineering: B（1999）
关键词
GaN MOCVD thin films,X-ray diffraction,Dislocations density,Hordon and Averbach’s model
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要