RTS Noise Impact in CMOS Image Sensors Readout Circuit

International Conference on Electronics, Circuits, and Systems (ICECS)（2009）

Cited 40|Views6

Abstract

CMOS image sensors are nowadays widely used in imaging applications even for high end applications. This is really possible thanks to a reduction of noise obtained, among others, by correlated double sampling (CDS) readout. Random telegraph signal (RTS) noise has thus become an issue for low light level applications especially in the context of downscaling transistor dimension. This paper describes the analysis of in-pixel source follower transistor RTS noise filtering by CDS circuit. The measurement of a non Gaussian distribution with a positive skew of image sensor output noise is analysed and dimension (W and L) impact of the in-pixel source follower is analysed.

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Key words

CMOS image sensors,Gaussian distribution,integrated circuit noise,CDS circuit,CMOS image sensors,RTS noise impact,correlated double sampling readout,in-pixel source follower,nonGaussian distribution,random telegraph signal noise,readout circuit,Correlated Double Sampling,Image sensors,RTS noise,low frequency noise

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