Peculiarities of Structure Formation of Thin Films and Determination of Their Plasmon-Resonance Properties

M. Yu. Barabash,A. A. Kolesnichenko,D. S. Leonov, R. V. Lytvyn, A. Yu. Sezonenko,I. V. Lukianenko, Ie. G. Byba, M. M. Yamshynskyi, Ye. M. Boboshko

METALLOPHYSICS AND ADVANCED TECHNOLOGIES（2023）

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diffractometry,electron microscopy,optical spectroscopy,thermal spraying,thin films,dimensional effects

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