Epitaxy of Deposited α-Fe Films on High-Index Cu Substrate Planes

MATERIALS SCIENCE FORUM(1996)

引用 0|浏览5
暂无评分
摘要
Thin alpha-Fe films were deposited onto the high-index planes, {212}, {113} and {213}, of Cu substrates. Multiple epitaxial relationships were found to exist in each substrate specimen. Particular growth directions of alpha-Fe films parallel to the [110] directions of Cu substrates were observed in the {212} and {113} substrate specimens. Simple geometrical criteria proposed previously are excellently applicable to the prediction of observed epitaxial relationships on the high-index substrate planes. It is concluded that three-dimensional orientation relationships must be considered to understand the crystallography and morphology of two-dimensional alpha-Fe films.
更多
查看译文
关键词
epitaxy,thin film,geometry,orientation relationship,invariant line,morphology
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要