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Statistical Sram Analysis for Yield Enhancement

Paul Zuber,Miguel Miranda,Petr Dobrovolny, Koen van der Zanden, Jong-Hoon Jung

Design, Automation, and Test in Europe(2010)

Cited 9|Views2
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Key words
SRAM wide statistical analysis,captures non-trivial statistical interaction,statistical electrical simulation,automated technique,digital corner approach,industry-grade SRAM vehicle,prototype tool,critical path,design phase,development time,Statistical SRAM analysis,yield enhancement
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