Design Of A Window Comparator With Adaptive Error Threshold For Online Testing Applications

This paper presents a novel window comparator circuit whose error threshold can be adoptively adjusted according to its input signal levels. It is ideal for analog online testing applications. Advantages of adaptive comparator error thresholds over constant or relative error thresholds in analog testing applications are discussed. Analytical equations for guiding the design of proposed comparator circuitry are derived. The proposed comparator circuit has been designed and fabricated using a CMOS 0.18 mu technology. Measurement results of the fabricated chip are presented.