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Papers共 102 篇Author StatisticsCo-AuthorSimilar Experts
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ADVANCED ETCH TECHNOLOGY AND PROCESS INTEGRATION FOR NANOPATTERNING XIII (2024)
A. Leśniewska,O. Varela Pedreira,Ph. J. Roussel, G. Marti, A. Pokhrel,M. van der Veen,S. Decoster, M. O’Toole,G. Murdoch,I. Ciofi,S. Park,Zs. Tőkei,K. Croes
2022 IEEE International Interconnect Technology Conference (IITC)pp.28-30, (2022)
C. Wu,V. Vega-Gonzalez, H. De Coster,Q. T. Le,F. Schleicher,A. Leśniewska,G. Murdoch,S. Park,Zs. Tőkei
2022 IEEE International Interconnect Technology Conference (IITC)pp.79-81, (2022)
Marleen H. van der Veen,O. Varela Pedreira,N. Jourdan,S. Park,H. Struyf,Zs. Tőkei, C. Leal Cerantes,F. Chen, X. Xie,Z. Wu, A. Jansen,J. Machillot,A. Cockburn
2022 IEEE International Interconnect Technology Conference (IITC)pp.129-131, (2022)
V. Vega-Gonzalez,D. Radisic,S. Choudhury,D. Tierno, A. Thiam,D. Batuk,G. T. Martinez, F. Seidel,S. Decoster,S. Kundu,D. Tsvetanova,A. Peter,H. de Coster, A. Sepulveda-Marquez,E. Altamirano-Sanchez,B. T. Chan,Y. Drissi,Y. Sherazi,J. Uk-Lee,I. Ciofi,G. Murdoch,N. Nagesh,G. Hellings,J. Ryckaert,S. Biesemans,E. Dentoni Litta,N. Horiguchi,S. Park,Zs. Tokei
A. Gupta,Z. Tao,D. Radisic,H. Mertens,O. Varela Pedreira,S. Demuynck,J. Boemmels,K. Devriendt,N. Heylen,S. Wang,K. Kenis,L. Teugels,F. Sebaai,C. Lorant,N. Jourdan,B. T. Chan,S. Subramanian,F. Schleicher,A. Peter,N. Rassoul, Y. Siew,B. Briggs,D. Zhou,E. Rosseel,E. Capogreco,G. Mannaert,A. Sepulveda,E. Dupuy,K. Vandersmissen,B. Chehab,G. Murdoch,E. Altamirano Sanchez,S. Biesemans,Zs Tokei,E. Dentoni Litta,N. Horiguchi
O. Varela Pedreira,V. Simons,M.H van der Veen,I. Ciofi,S. Park,Zs. Tõkei,K. Croes,S. Pethe,W. Lei, S. Hwang,Z. Wu,F. Chen, A. Jansen,J. Machillot,A. Cockburn
2022 IEEE International Interconnect Technology Conference (IITC)pp.31-33, (2022)
A. Gupta,D. Radisic, J. W. Maes,O. Varela Pedreira, J-P Soulie,N. Jourdan,H. Mertens, S. Bandyopadhyay,Q. T. Le,A. Pacco,N. Heylen,K. Vandersmissen,K. Devriendt,C. Zhu,S. Datta,F. Sebaai,S. Wang,M. Mousa, J. Lee,J. Geypen,B. De Wachter,B. Chehab,S. M. Salahuddin,G. Murdoch,S. Biesemans,Zs Tokei,E. Dentoni Litta,N. Horiguchi
2021 IEEE International Electron Devices Meeting (IEDM) (2021)
International Interconnect Technology Conferencepp.1-3, (2021)
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Author Statistics
#Papers: 102
#Citation: 1188
H-Index: 20
G-Index: 29
Sociability: 6
Diversity: 2
Activity: 2
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