The principle aim of my research is to build an understanding of important electronic and optoelectronic processes in a wide range of materials from the atomic scale up. In particular, the role of interfaces in organic and nanoscale materials is often of crucial importance for applications oriented processes, yet is frequently not fully understood. Scanning probe microscopy offers the ability to investigate such interfaces at the atomic level.
My research program makes use of scanning probe microscopy (SPM) techniques including atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) in ultrahigh vacuum (UHV) and at low temperatures (~4K). This clean, low-temperature environment allows the characterization of well defined systems, with sufficiently high energy resolution for most organic and nanoscale systems of interest, and with the level of stability required to achieve measurements on individual nanostructures.