Fuchs, S. - Inst. of Opt. & Quantum Electron., Friedrich-Schiller Univ. of Jena;c;Inst. of Opt. & Quantum Electron., Friedrich-Schiller Univ. of Jena

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Optical coherence tomography of encapsulated two-dimensional materials using extreme ultraviolet radiation from high-harmonic generation sources

Felix Wiesner,Julius Reinhard,Johann J. Abel,Martin Wünsche,Gerhard G. Paulus,Silvio Fuchs

High-Brightness Sources and Light-Driven Interactions Congress (2024)

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Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Felix Wiesner,Johann J. Abel, Muhammad Hussain, Vipin Krishna,Alisson R. Cadore, Juan P. G. Felipe,Ana M. Valencia,Martin Wuensche,Julius Reinhard,Marco Gruenewald,Caterina Cocchi,Gerhard G. Paulus,Giancarlo Soavi,Silvio Fuchs

ADVANCED MATERIALS INTERFACES（2024）

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Correlative Fluorescence and Soft X-Ray Microscopy in an Integrated Laboratory-based Setup

Julius Reinhard,Sophia Kaleta,Johann Jakob Abel,Felix Wiesner,Martin Wünsche,Eric Seemann,Martin Westermann,Thomas Weber,Jan Nathanael,Alexander Iliou,Henryk Fiedorowicz,Falk Hillmann,Christian Eggeling,Gerhard G. Paulus,Silvio Fuchs

High-Brightness Sources and Light-Driven Interactions Congress (2024)

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Non-destructive Depth Reconstruction of Al-Al_2Cu Layer Structure with Nanometer Resolution Using Extreme Ultraviolet Coherence Tomography

Johann J. Abel,Jonathan Apell,Felix Wiesner,Julius Reinhard,Martin Wuensche,Nadja Felde,Gabriele Schmidl,Jonathan Plentz,Gerhard G. Paulus,Stephanie Lippmann,Silvio Fuchs

MATERIALS CHARACTERIZATION (2024)

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Laboratory-Based Correlative Soft X-ray and Fluorescence Microscopy in an Integrated Setup

Julius Reinhard,Sophia Kaleta,Johann Jakob Abel,Felix Wiesner,Martin Wuensche,Eric Seemann,Martin Westermann,Thomas Weber,Jan Nathanael,Alexander Iliou,Henryk Fiedorowicz,Falk Hillmann,Christian Eggeling,Gerhard G. Paulus,Silvio Fuchs

MICROSCOPY AND MICROANALYSISno. 6 (2023): 2014-2025

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Absolute EUV Reflectivity Measurements Using a Broadband High-Harmonic Source and an in Situ Single Exposure Reference Scheme

Johann j. Abel,Felix Wiesner,Jan Nathanael,Julius Reinhard,Martin Wuensche,Gabriele Schmidl,Annett Gawlik,Uwe Huebner,Jonathan Plentz,Christian Roedel,Gerhard G. Paulus,Silvio Fuchs

Optics Express（2022）

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Broadband Soft X-ray Source from a Clustered Gas Target Dedicated to High-Resolution XCT and X-ray Absorption Spectroscopy

Karol A. Janulewicz,Lukasz Wegrzynski,Tomasz Fok,Andrzej Bartnik,Henryk Fiedorowicz,Slawomir Skruszewicz,Martin Wuensche, Erich Eckner,Silvio Fuchs,Julius Reinhard,Johann J. Abel,Felix Wiesner,Gerhard G. Paulus,Christian Roedel,Chul Min Kim,Przemyslaw W. Wachulak

Optics express（2022）

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Characterization of encapsulated graphenelayers using extreme ultraviolet coherencetomography

Felix Wiesner,Slawomir Skruszewicz,Christian Roedel,Johann Abel,Julius Reinhard,Martin Wünsche,Jan Nathanael,Marco Grünewald,Uwe Hübner,Gerhard Paulus,Silvio Fuchs

Optics Expressno. 18 (2022): 32267-32279

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Material-specific Imaging of Nanolayers Using Extreme Ultraviolet Coherence Tomography

Felix Wiesner,Martin Wuensche,Julius Reinhard,Johann Jakob Abel,Jan Nathanael,Slawomir Skruszewicz,Christian Roedel,Sergiy Yulin,Annett Gawlik,Gabriele Schmidl,Uwe Huebner,Jonathan Plentz,Gerhard G. Paulus,Silvio Fuchs

Optica（2021）

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Material-specific analysis of multi-layers with XUV Coherence Tomography

Silvio Fuchs,Felix Wiesner,Martin Wünsche,Johann Jakob Abel,Julius Reinhard,Jan Nathanael,Slawomir Skruszewicz,Christian Rödel,Gerhard G. Paulus

semanticscholar（2021）

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