Soon-Cheon Seo - SEMATECH | 人才画像

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论文共 66 篇作者统计合作学者相似作者

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Demonstration of Transfer Learning Using 14 Nm Technology Analog ReRAM Array

Fabia Farlin Athena,Omobayode Fagbohungbe,Nanbo Gong,Malte J. Rasch, Jimmy Penaloza,Sooncheon Seo,Arthur Gasasira,Paul Solomon,Valeria Bragaglia,Steven Consiglio,Hisashi Higuchi,Chanro Park,Kevin Brew,Paul Jamison,Christopher Catano,Iqbal Saraf, Claire Silvestre, Xuefeng Liu, Babar Khan, Nikhil Jain,Steven Mcdermott, Rick Johnson,I. Estrada-Raygoza,Juntao Li,Tayfun Gokmen,Ning Li,Ruturaj Pujari,Fabio Carta,Hiroyuki Miyazoe,Martin M. Frank,Antonio La Porta,Devi Koty,Qingyun Yang,Robert D. Clark,Kandabara Tapily,Cory Wajda,Aelan Mosden, Jeff Shearer,Andrew Metz,Sean Teehan,Nicole Saulnier,Bert Offrein, Takaaki Tsunomura,Gert Leusink,Vijay Narayanan,Takashi Ando

FRONTIERS IN ELECTRONICS (2024)

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Reliable Cu pillar undercut control using the endpoint detection system

Zachary Gardner,Soon-cheon Seo, Pijeng Khor, Chris Waskiewicz,M. Sankarapandian,Eric Perfecto,James Demarest

2024 35TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, ASMCpp.1-3, (2024)

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Deep Learning Acceleration in 14nm CMOS Compatible ReRAM Array: Device, Material and Algorithm Co-Optimization

N. Gong,M. J. Rasch,S. -C. Seo,A. Gasasira,P. Solomon,V. Bragaglia,S. Consiglio, H. Higuchi, C. Park,K. Brew,P. Jamison,C. Catano,I. Saraf,F. F. Athena,C. Silvestre, X. Liu, B. Khan,N. Jain,S. Mcdermott, R. Johnson,I. Estrada-Raygoza, J. Li,T. Gokmen,N. Li,R. Pujari,F. Carta,H. Miyazoe,M. M. Frank, D. Koty, Q. Yang,R. Clark,K. Tapily,C. Wajda,A. Mosden, J. Shearer, A. Metz,S. Teehan,N. Saulnier, B. J. Offrein,T. Tsunomura,G. Leusink,V. Narayanan, T. Ando

International Electron Devices Meeting（2022）

引用4浏览0EIWOS引用

Process-Induced ReRAM Performance Improvement of Atomic Layer Deposited HfO2 for Analog In-Memory Computing Applications

Steven Consiglio,Hisashi Higuchi,Takashi Ando,Paul C. Jamison,Soon-Cheon Seo,Dexin Kong,Youngseok Kim,Kandabara Tapily,Robert D. Clark,Marinus Hopstaken,Eduard A. Cartier, Tsunomura Takaaki,Cory Wajda, Robert Soave,Vijay Narayanan,Gert J. Leusink

Electrochemical Society Transactionsno. 2 (2021): 19-28

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Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices Towards Scalable Analog Compute Technology for Deep Learning

Ruturaj Pujari,Arthur Gasasira,Youngseok Kim,Veenadhar Katragadda,Soon-Cheon Seo,Dexin Kong, Xuefeng Liu,Sean Teehan,Nicole Saulnier,Ishtiaq Ahsan,Vijay Narayanan,Takashi Ando

2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)（2021）

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Hardware Algorithm Co-optimization on Resistive RAM Cross-bar Array for Scalable Analog Compute Technology for AI application

Y. Kim,S. C. Seo,P. Jamison,S. Consiglio, H. Higuchi,H. Miyazoe,P. Solomon, S. Kim,T. Gokmen,K. Tapily,R. D. Clark,T. Tsunomura, C. S. Wajda,W. Haensch, R. Soave,G. J. Leusink,V Narayanan,T. Ando

2021 Silicon Nanoelectronics Workshop (SNW)pp.57-58, (2021)

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Bottom Electrode Properties and Electrical Field Cycling Effects on HfOx Based Resistive Switching Memory Device

J. Li,Y. Kim,D. Kong,K. Cheng,S. -C. Seo, C. Robinson,N. Saulnier, R. R. Robison, A. J. Varghese,I. Ahsan,R. Muralidhar,T. Ando,V. Narayanan

Proceedings - International Symposium for Testing and Failure Analysis (2020)

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Challenges in the Patterning of RRAM Devices for Analog Computing Applications (conference Presentation)

Iqbal Saraf,Shyam Sridhar,Christopher Catano,Sergey Voronin,Dexin Kong,Soon-Cheon Seo,Youngseok Kim,Takashi Ando,Nicole Saulnier,Vijay Narayanan

Advanced Etch Technology for Nanopatterning IX (2020)

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In-line Characterization of Non-Selective SiGe Nodule Defects with Scatterometry Enabled by Machine Learning

Dexin Kong,Robinhsinkuo Chao,Mary Breton,Chi-chun Liu,Gangadhara R. Muthinti,Soon-Cheon Seo,Nicolas J. Loubet,Pietro Montanini,John Gaudiello,Veeraraghavan Basker,Aron J. Cepler, Susan Ng-Emans,Matthew Sendelbach, Itzik Kaplan,Gilad Barak,Daniel Schmidt,Julien Frougier

Metrology, Inspection, and Process Control for Microlithography XXXII (2018)

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Stacked Nanosheet Gate-All-Around Transistor to Enable Scaling Beyond Finfet

N. Loubet,T. Hook,P. Montanini,C. -W. Yeung,S. Kanakasabapathy,M. Guillorn,T. Yamashita,J. Zhang,X. Miao,J. Wang, A. Young,R. Chao, M. Kang,Z. Liu,S. Fan,B. Hamieh,S. Sieg,Y. Mignot,W. Xu,S. -C. Seo, J. Yoo,S. Mochizuki,M. Sankarapandian,O. Kwon,A. Carr,A. Greene,Y. Park,J. Frougier,R. Galatage,R. Bao,J. Shearer,R. Conti, H. Song,D. Lee,D. Kong, Y. Xu,A. Arceo,Z. Bi,P. Xu, R. Muthinti,J. Li,R. Wong, D. Brown,P. Oldiges,R. Robison,J. Arnold,N. Felix,S. Skordas,J. Gaudiello,T. Standaert,H. Jagannathan,D. Corliss,M. -H. Na,A. Knorr,T. Wu,D. Gupta,S. Lian,R. Divakaruni, T. Gow,C. Labelle,S. Lee,V. Paruchuri,H. Bu,M. Khare

2017 Symposium on VLSI Technology（2017）

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