基本信息
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Career Trajectory
Bio
Robert J Polastre received the Associates degree in electronic technology and the B.S. degree from LaSalle University, Philadelphia, PA.
He is an Advisory Engineer working in the System on A Package Group, IBM, Yorktown Heights, NY. He joined the IBM Research Division in 1983. He is the author or co-author of several papers on automated and thermal testing and is a co-inventor of patents in these areas.
Mr. Polastre received Outstanding Technical Achievement Awards in 1990 and 1999 and an IBM Corporate Award in 1993 for his work on array testing of thin film transistors.
Research Interests
Papers共 54 篇Author StatisticsCo-AuthorSimilar Experts
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Bing Dang, Colgan Evan, Yang Fanghao, Schultz Mark, Liu Yang, Chen Qianwen, Nah Jae-Woong,Polastre Robert, Gaynes Michael, McVicker Gerard,Parida Pritish,Tsang Cornelia,Knickerbocker John, Chainer Timothy
IEEE Conference Proceedings (2016): 1271-1277
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INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, 2015, VOL 3 (2015)
mag(2015)
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Author Statistics
#Papers: 54
#Citation: 3194
H-Index: 27
G-Index: 49
Sociability: 6
Diversity: 2
Activity: 0
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