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Papers共 133 篇Author StatisticsCo-AuthorSimilar Experts
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Gopal Sankar Kenath,Martin Burkhardt, Nikhil Jain, Anna Lin,Jennifer Church,Gen Tsutsui, Stephanie Reynoso, Xuan Liu, Chris Sheraw,Pietro Montanini,Eric Miller,Indira Seshadri,Luciana Meli,Nelson Felix
OPTICAL AND EUV NANOLITHOGRAPHY XXXVII (2024)
Curtis Durfee, Ivo Otto, Subhadeep Kal,S. Pancharatnam,Matthew Flaugh, Toshiki Kanaki, Matthew Rednor,Huimei Zhou,Lu Qin,Luciana Meli,N. Loubet,Peter Biolsi,Nelson Felix
ECS transactionsno. 1 (2023): 45-52
I. Seshadri, E. Miller, J. Church, A. Chu,J. Zhang,A. Greene,J. Frougier, T. Li, Y. Cabrera, G. Kenath, M. Burkhardt,S. Skordas, L. Meli,N. Felix
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
Curtis S Durfee, Ivo Otto,Subhadeep Kal,Shanti Pancharatnam,Matthew Flaugh, Toshiki Kanaki, Matthew Rednor,Huimei Zhou,Liqiao Qin,Juntao Li,Luciana Meli,Nicolas Loubet,Peter Biolsi,Nelson Felix
Extended Abstracts of the 2023 International Conference on Solid State Devices and Materials (2023)
Shogo Mochizuki,Nicolas Loubet, Pial Mirdha,Curtis Durfee,Huimei Zhou, Gen Tsusui,Julien Frougier,Reinaldo Vega,Liqiao Qin,Nelson Felix,Dechao Guo,Huiming Bu
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (2022)
Metrology, Inspection, and Process Control XXXVI (2022)
Metrology, Inspection, and Process Control XXXVI (2022)
Eric R. Miller,Indira Seshadri, Tsung-Sheng Kang,Dominik Metzler, Joe Lee,Stuart Sieg,Sebastian U. Engelmann, Jeff Shearer,John Arnold,Nelson Felix
Advanced Etch Technology and Process Integration for Nanopatterning XI (2022)
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Author Statistics
#Papers: 135
#Citation: 2068
H-Index: 21
G-Index: 43
Sociability: 6
Diversity: 2
Activity: 1
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