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个人简介
John M. Aitken (SM'92) received the B.S. degree in physics from Fordham University, Bronx, NY, and the M.S. and Ph.D. degrees in physics/materials science from Rensselaer Polytechnic Institute, Troy, NY.
In 1974, he was with the IBM T.J. Watson Research Center. He is currently a Senior Technical Staff Member with the IBM Burlington, Essex Junction, VT, managing the Semiconductor Technology Reliability Engineering Department evaluating the reliability of new technologies and materials for advanced semiconductor device technologies. He is also currently an Adjunct Professor with the University of Vermont, Burlington. He has numerous technical publications and patents in the area of semiconductor devices, materials, and physics.
Dr. Aitken is a past committee member and General Chairman of the International Electron Devices Meeting. He is a past member of the IEEE Awards Committee and the Chair of the Cledo Brunetti Award Committee. He is an IBM representative to the Semiconductor Research Corporation Advisory Boards, acting as alternate Executive Committee member, and is a past member and chairman of the Process Integration and Device Technical Advisory Boards. Currently, he is a member of the SEMATECH Reliability Technical Advisory Board.
研究兴趣
论文共 16 篇作者统计合作学者相似作者
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Fen Chen,S Mittl,M Shinosky,Roger A Dufresne,J M Aitken, Yanfeng Wang, K Kolvenback,W K Henson,D Mocuta
Fen Chen,Jeffrey P Gambino,M Shinosky,J M Aitken,Elbert Huang,Stephan A Cohen,Chihchao Yang,Daniel C Edelstein, Yun Wang, Terry Kane,D Kioussis
F Chen,M Shinosky,Bo Li, Charles Christiansen, Tongyee Lee,J Aitken,D Badami,Elbert Huang,Griselda Bonilla,T M Ko,Terence Kane, Yi Wang, M M Zaitz, L Nicholson,M Angyal, Carolyn Truong,X Chen, G Yang,T J Tang,S Petitdidier,G Ribes, Manho Oh,C Child,Hiroshi Sawada,Artur Kolics, O Rigoutat, N Gilbert
F Chen,M. Shinosky,B. Li,C. Christiansen, T Lee,J. Aitken,D. Badami,E. Huang,Griselda Bonilla,Ko T.-M.,Terence Kane, Y Wang, M. Zaitz, Lee M. Nicholson,M. Angyal,Connie Truong, X Chen, Guifu Yang, S. B. Law,Teck Jung Tang,Sébastien Petitdidier,G. Ribes, M. Oh,Craig Child, H Sawada,A. Kolics, O Rigoutat, N Gilbert
International Reliability Physics Symposiumpp.566-573, (2010)
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作者统计
#Papers: 16
#Citation: 654
H-Index: 10
G-Index: 15
Sociability: 5
Diversity: 2
Activity: 0
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