基本信息
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职业迁徙
个人简介
Ivan Ciofi received the M.S. and Ph.D. degrees in electronic engineering from the University of Pisa, Pisa, Italy.
In 2001, he joined imec, working on BEOL process technology. He was appointed as a Senior Researcher in 2007, in the role of supervising the electrical characterization of materials and processes for advanced CMOS interconnects. Since 2012, he has been involved in design-technology co-optimization for the definition of the imec interconnect technology roadmap.
研究兴趣
论文共 104 篇作者统计合作学者相似作者
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2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
D. Tierno,A. Arreghini,A. Lesniewska, Y. Jeong,M. H. van der Veen,J. Stiers, N. Bazzazian,I. Ciofi,G. Van den Bosch,M. Rosmeulen
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-4, (2023)
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS (2023)
2023 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE, IITC AND IEEE MATERIALS FOR ADVANCED METALLIZATION CONFERENCE, MAM, IITC/MAM (2023)
2023 IEEE International Reliability Physics Symposium (IRPS)pp.1-6, (2023)
ISPD '23: Proceedings of the 2023 International Symposium on Physical Designpp.106-106, (2023)
Giuliano Sisto, R. Preston, R. Chen,Gioele Mirabelli,Anita Farokhnejad, Y. Zhou,Ivan Ciofi,Anne Jourdain,A. Veloso,Michele Stucchi,Odysseas Zografos,Pieter Weckx,Geert Hellings,Julien Ryckaert
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (2023)
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作者统计
#Papers: 104
#Citation: 1315
H-Index: 20
G-Index: 33
Sociability: 6
Diversity: 2
Activity: 4
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