Huang Hui (M’16) was born in Hunan, China. He received the Ph.D. degree in electromagnetic field and microwave technology from the Beijing Institute of Technology, Beijing, China, in 2014. He joined the Division of Electronics and Information Technology, National Institute of Metrology (NIM), Beijing, in 2005, where he was an Associate Researcher in 2012. He was involved in the research and development of microwave S-parameters metrology standards and related its traceability systems with NIM. From 2013 to 2014, he carried out his collaborative research as a Visiting Research Scholar in the area of measurements of millimeter-wave and terahertz S-parameters with the National Physical Laboratory, Middlesex, U.K. From June 2015, he is with Xinchen Technologies Company, Ltd., Beijing. His current research interests include coaxial and metallic waveguide S-parameters measurement in high-frequency, and on-wafer S-parameters measurement in high-speed electronics. Dr. Hui is a member of the Automatic RF Techniques Group and the IEEE MTT-S Technical Committee on Microwave Measurements (MTT-11).