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论文共 139 篇作者统计合作学者相似作者

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Measurement of the Neutron Total Cross Section of 9be at the Back-n White Neutron Source of CSNS
Jiangbo Bai,Jingyu Tang,Liqun Shi, Yonghao Chen,Han Yi, Jie Bao,Yu Bao,Ping Cao, Haolei Chen,Zhen Chen, Zengqi Cui,Ruirui Fan,Changqing Feng, Keqing Gao, Xiaolong Gao,MinHao Gu, Changcai Han, Guozhu He,Yongcheng He,Yang Hong, Yiwei Hu, Hanxiong Huang, Xiru Huang, Haoyu Jiang,Wei Jiang, Zhijie Jiang,Hantao Jing,Ling Kang,Bo Li,Chao Li, Jiawen Li,Qiang Li,Xiao Li,Yang Li,Jie Liu,Shubin Liu,Ze Long, Guangyuan Luan, Changjun Ning, Mengchen Niu, Binbin Qi,Jie Ren,Xichao Ruan, Zhaohui Song, Kang Sun,Zhijia Sun, Zhixin Tan, Xinyi Tang, Binbin Tian, Lijiao Wang, Pengcheng Wang, Zhaohui Wang,Xiaoguang Wu, Xuan Wu, Likun Xie, Xiaoyun Yang, Li Yu,Tao Yu, Yongji Yu,Guohui Zhang, Linhao Zhang, Qiwei Zhang, Xianpeng Zhang,Yuliang Zhang,Zhiyong Zhang, Luping Zhou, Zhihao Zhou,Kejun Zhu
CHINESE PHYSICS C（2024）
引用20浏览0引用
20
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A Study on the Channel Holes’ Diameter Effects of High-Performance Vertical-Channel Flash Memory Cells
Zijin Yan,Huilong Zhu,Hong Yang,Junjie Li,Shunshun Lu,Chenchen Zhang, Shuai Yang, Tianyu Bai, Kaiqiang Zhao, Liang Xiang, Yongkui Zhang,Junfeng Li,Jun Luo,T. C. Ye
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGYno. 10 (2024)
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Distribution of HCD-induced Interface Trap in Nano-Scale Si N-Finfet Due to Corner Effect
Mingvang Sun, Ruixi Yu, Yunfei Shil,Hong Yang,Qianqian Liu,Bo Tang,Xiaobin He,Jianfeng Gao,Junfeng Li,Huaxiang Yin,Jun Luo,Wenwu Wang
2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)pp.1-5, (2024)
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作者统计

#Papers: 138

#Citation: 1498

H-Index: 20

G-Index: 34

Sociability: 6

Diversity: 3

Activity: 50

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