Prof. Bian’s research focuses on precise fabrication and spectroscopic characterization of low-dimensional quantum systems and novel electronic materials. He is also interested in the physical properties of new functional materials including their growth mechanism, electronic and magnetic structure, surface and interfacial physics, and quantum size effects. The primary experimental techniques include angle-resolved photoemission spectroscopy (ARPES), scanning tunneling microscope (STM) and molecular beam epitaxy (MBE). His group constructed the Missouri Integrated Nano-Analysis System (MINAS) experimental platform. The MINAS system is equipped with APRES, MBE, and STM, which is fully capable of various sample growth and spectroscopic characterizations.