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Papers共 25 篇Author StatisticsCo-AuthorSimilar Experts
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K. Deslandes,F. Vachon,T. Rossignol,S. Parent,N. Roy, C. Pepin, O. Lepage,L. Fabris,P. A. Hausladen, F. Retiere, J.-F. Pratte,S. A. Charlebois
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)pp.1-2, (2024)
Samuel Parent,Frederic Vachon,Valerie Gauthier, Steve Lamoureux, Alexandre Paquette,Jacob Deschamps,Tommy Rossignol,Nicolas Roy,Philippe Arsenault,Henri Dautet,Serge A. Charlebois,Jean-Francois Pratte
Simon Carrier, Michel Labrecque-Dias,Ramy Tannous,Pascal Gendron,Frederic Nolet,Nicolas Roy,Tommy Rossignol,Frederic Vachon,Samuel Parent,Thomas Jennewein,Serge Charlebois,Jean-Francois Pratte
F. Nolet,Valérie Gauthier,Samuel Parent,F. Vachon,N. Roy, Nicolas St-Jean,Serge A. Charlebois,J.‐F. Pratte
Instrumentsno. 2 (2023): 16-16
Jean-Francois Pratte,Keven Deslandes,Tommy Rossignol,Nicolas Roy,Frederic Vachon, Robin Scarpellini, Guillaume Theberge-Dupuis,Paul A. Hausladen,Lorenzo Fabris,Serge A. Charlebois
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXV (2023)
Jonathan Asaadi, Dan Baxter,Karl K. Berggren,Davide Braga,Serge A. Charlebois,Clarence Chang,Angelo Dragone,Alex Drlica-Wagner,Carlos O. Escobar,Juan Estrada,Farah Fahim,Michael Febbraro,Guillermo Fernandez Moroni,Stephen Holland,Todd Hossbach,Stewart Koppell,Christopher Leitz,Agustina Magnoni,Benjamin A. Mazin,Jean-François Pratte,Bernie Rauscher,Dario Rodrigues,Lingjia Shen,Miguel Sofo-Haro,Javier Tiffenberg,Joshua Turner,Lorenzo Rota,Christopher J. Kenney,Frédéric Vachon,Gensheng Wang
OSTI OAI (US Department of Energy Office of Scientific and Technical Information) (2022)
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B. G. Lenardo,C. A. Hardy,R. H. M. Tsang,J. C. Nzobadila Ondze,A. Piepke,S. Triambak,A. Jamil,G. Adhikari,S. Al Kharusi,E. Angelico,I. J. Arnquist,V Belov,E. P. Bernard,A. Bhat,T. Bhatta,A. Bolotnikov,P. A. Breur,J. P. Brodsky,E. Brown,T. Brunner,E. Caden,G. F. Cao, L. Cao,B. Chana,S. A. Charlebois,D. Chernyak,M. Chiu,J. R. Cohen,R. Collister,J. Dalmasson,T. Daniels,L. Darroch,R. DeVoe,M. L. di Vacri,Y. Y. Ding,M. J. Dolinski,J. Echevers,B. Eckert,M. Elbeltagi,L. Fabris,D. Fairbank,W. Fairbank,J. Farine,Y. S. Fu,G. Gallina,P. Gautam,G. Giacomini,W. Gillis,C. Gingras,R. Gornea,G. Gratta,K. Harouaka,M. Heffner,E. Hein,J. Hossl,A. House,A. Iverson, X. S. Jiang,A. Karelin,L. J. Kaufman,R. Krucken,A. Kuchenkov,K. S. Kumar,A. Larson,K. G. Leach,D. S. Leonard,G. Li,S. Li,Z. Li,C. Licciardi,R. Lindsay,R. MacLellan,J. Masbou,K. McMichael,M. Medina Peregrina,B. Mong,D. C. Moore,K. Murray,J. Nattress,C. R. Natzke,X. E. Ngwadla,K. Ni,Z. Ning,J. L. Orrell,G. S. Ortega,I Ostrovskiy,C. T. Overman,A. Perna,T. Pinto Franco,A. Pocar,J. F. Pratte,N. Priel,E. Raguzin,G. J. Ramonnye,H. Rasiwala,K. Raymond,G. Richardson,M. Richman,J. Ringuette,P. C. Rowson,R. Saldanha,S. Sangiorgio,X. Shang,A. K. Soma,F. Spadoni,V Stekhanov,X. L. Sun,S. Thibado,A. Tidball,J. Todd,T. Totev,O. A. Tyuka,F. Vachon,V. Veeraraghavan,S. Viel,K. Wamba, Y. Wang,Q. Wang,W. Wei,L. J. Wen,U. Wichoski,S. Wilde,W. H. Wu,W. Yan,L. Yang,O. Zeldovich,J. Zhao,T. Ziegler
Journal of instrumentationno. 07 (2022): P07028-P07028
Samuel Parent,Frederic Vachon,Valerie Gauthier, Alexandre Paquette,Jacob Deschamps,Tommy Rossignol,Philippe Arsenault,Caroline Paulin, Joel Lemay,Nicolas Roy,Maxime Cote, Denis Dupont,Stephane Martel,Henri Dautet,Serge A. Charlebois,Jean-Francois Pratte
2022 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)pp.155-158, (2022)
G. Gallina, Y. Guan,F. Retiere,G. Cao,A. Bolotnikov,I. Kotov,S. Rescia,A. K. Soma,T. Tsang,L. Darroch,T. Brunner, J. Bolster,J. R. Cohen,T. Pinto Franco,W. C. Gillis, H. Peltz Smalley,S. Thibado,A. Pocar,A. Bhat,A. Jamil,D. C. Moore,G. Adhikari,S. Al Kharusi,E. Angelico,I. J. Arnquist, P. Arsenault,I. Badhrees,J. Bane,V. Belov,E. P. Bernard,T. Bhatta,P. A. Breur,J. P. Brodsky,E. Brown,E. Caden,L. Cao,C. Chambers,B. Chana,S. A. Charlebois,D. Chernyak,M. Chiu,B. Cleveland,R. Collister,M. Cvitan,J. Dalmasson,T. Daniels,K. Deslandes,R. DeVoe,M. L. di Vacri, Y. Ding,M. J. Dolinski,A. Dragone,J. Echevers,B. Eckert,M. Elbeltagi,L. Fabris,W. Fairbank,J. Farine,Y. S. Fu,D. Gallacher,P. Gautam,G. Giacomini,C. Gingras,D. Goeldi,R. Gornea,G. Gratta,C. A. Hardy,S. Hedges,M. Heffner,E. Hein,J. Holt,E. W. Hoppe,J. Hößl,A. House,W. Hunt,A. Iverson,X. S. Jiang,A. Karelin,L. J. Kaufman,R. Krücken,A. Kuchenkov,K. S. Kumar,A. Larson,K. G. Leach,B. G. Lenardo,D. S. Leonard, G. Lessard,G. Li,S. Li,Z. Li,C. Licciardi,R. Lindsay,R. MacLellan,M. Mahtab,S. Majidi,C. Malbrunot,P. Margetak,P. Martel-Dion,L. Martin,J. Masbou,N. Massacret,K. McMichael,B. Mong,K. Murray,J. Nattress,C. R. Natzke,X. E. Ngwadla,J. C. Nzobadila Ondze,A. Odian,J. L. Orrell,G. S. Ortega,C. T. Overman,S. Parent,A. Perna,A. Piepke, N. Pletskova,J. F. Pratte,V. Radeka,E. Raguzin,G. J. Ramonnye,T. Rao,H. Rasiwala,K. Raymond,B. M. Rebeiro,G. Richardson,J. Ringuette,V. Riot,T. Rossignol,P. C. Rowson, L. Rudolph,R. Saldanha,S. Sangiorgio,X. Shang,F. Spadoni,V. Stekhanov,X. L. Sun,A. Tidball,T. Totev,S. Triambak,R. H. M. Tsang,O. A. Tyuka,F. Vachon,M. Vidal,S. Viel,G. Visser,M. Wagenpfeil,M. Walent,K. Wamba,Q. Wang,W. Wang, Y. Wang,M. Watts,W. Wei,L. J. Wen,U. Wichoski,S. Wilde,M. Worcester,W. H. Wu,X. Wu, L. Xie,W. Yan,H. Yang,L. Yang,O. Zeldovich,J. Zhao,T. Ziegler
The European Physical Journal Cno. 12 (2022)
T. Stiegler,S. Sangiorgio,J. P. Brodsky,M. Heffner,S. Al Kharusi,G. Anton,I. J. Arnquist,I Badhrees,P. S. Barbeau,D. Beck,V Belov,T. Bhatta,A. Bolotnikov,P. A. Breur,E. Brown,T. Brunner,E. Caden,G. F. Cao, L. Cao,C. Chambers,B. Chana,S. A. Charlebois,M. Chiu,B. Cleveland,M. Coon,A. Craycraft,J. Dalmasson,T. Daniels,L. Darroch,A. De St Croix,A. Der Mesrobian-Kabakian,K. Deslandes,R. DeVoe,M. L. Di Vacri,J. Dilling,Y. Y. Ding,M. J. Dolinski,A. Dragone,J. Echevers,F. Edaltafar,M. Elbeltagi,L. Fabris,D. Fairbank,W. Fairbank,J. Farine,S. Ferrara,S. Feyzbakhsh,G. Gallina,P. Gautam,G. Giacomini,D. Goeldi,R. Gornea,G. Gratta,E. Hansen,E. W. Hoppe,J. Hoessl,A. House,M. Hughes,A. Iverson,A. Jamil,M. J. Jewell, X. S. Jiang,A. Karelin,L. J. Kaufman,T. Koffas,R. Kruecken,A. Kuchenkov,K. S. Kumar,Y. Lan,A. Larson,K. G. Leach,B. G. Lenardo,D. S. Leonard,G. Li,S. Li,Z. Li,C. Licciardi,P. Lv,R. MacLellan,N. Massacret,T. McElroy,M. Medina-Peregrina,T. Michel,B. Mong,D. C. Moore,K. Murray,P. Nakarmi,C. R. Natzke,R. J. Newby,K. Ni,Z. Ning,O. Njoya,F. Nolet,O. Nusair,K. Odgers,A. Odian,M. Oriunno,J. L. Orrell,G. S. Ortega,I Ostrovskiy,C. T. Overman,S. Parent,A. Piepke,A. Pocar,J-F Pratte,V Radeka,E. Raguzin,S. Rescia,F. Retiere,M. Richman,A. Robinson,T. Rossignol,P. C. Rowson,N. Roy,R. Saldanha,K. Skarpaas,A. K. Soma,G. St-Hilaire,V Stekhanov,X. L. Sun,M. Tarka,S. Thibado,A. Tidball,J. Todd,T. Totev,R. Tsang,T. Tsang,F. Vachon,V. Veeraraghavan,S. Viel,G. Visser,C. Vivo-Vilches,J-L Vuilleumier,M. Wagenpfeil,T. Wager,M. Walent,Q. Wang,W. Wei,L. J. Wen,U. Wichoski,M. Worcester,S. X. Wu,W. H. Wu,X. Wu,Q. Xia,H. Yang,L. Yang,O. Zeldovich,J. Zhao,Y. Zhou,T. Ziegler
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Author Statistics
#Papers: 25
#Citation: 338
H-Index: 8
G-Index: 17
Sociability: 6
Diversity: 2
Activity: 5
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