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论文共 56 篇作者统计合作学者相似作者

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Superlattice Effects and Limitations of Non-Destructive Measurement of Advanced Si/Si(1-x)Ge(x) Superlattice Structures Using Mueller Matrix Scatterometry (MMSE) and High-Resolution X-Ray Diffraction (XRD)
Ezra Pasikatan,G. Andrew Antonelli,Nicholas Keller,Subhadeep Kal, Matthew Rednor, Markus Kuhn, Satoshi Murakami, Alain C. Diebold
Journal of Micro/Nanopatterning, Materials, and Metrologyno. 04 (2024)
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Epi Source-Drain Damage Mitigation During Channel Release of Stacked Nanosheet Gate-All-Around Transistors
Curtis Durfee, Ivo Otto IV,Subhadeep Kal,Shanti Pancharatnam,Matthew Flaugh,Toshiki Kanaki, Matthew Rednor, Huimei Zhou,Liqiao Qin,Luciana Meli, Nicolas Loubet,Peter Biolsi, Nelson Felix
ECS Meeting Abstractsno. 30 (2023): 1517-1517
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Feasibility Study of Machine Learning Modeling for Full Chip Optical Proximity Correction
Yuping Cui, Jing Xue, Jing Sha, Zheng Guo Chen, Larry Zhuang,Derren Dunn,Jeffrey Shearer, Li-Jin Chen, Rich Wu,Charlie King
DTCO and Computational Patterning (2022)
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Speeding Up Opc By Leveraging Existing Designs With Machine Learning
Cheng Chi,Julian Dolby, Jeffrery C. Shearer,Derren Dunn,Sean Burns
DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION XV (2021)
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作者统计

#Papers: 57

#Citation: 551

H-Index: 13

G-Index: 22

Sociability: 6

Diversity: 2

Activity: 0

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