Dr. Kiely is interested in the application of advanced transmission electron microscopy techniques for the study of nanoscale features in materials. Specific areas of interest include catalyst materials, nanoparticle self-assembly, quantum dot materials, carbonaceous materials, and heteroepitaxial interfaces. Current microscopy technique development interests include aberration corrected analytical electron microscopy (AC-AEM), STEM XEDS/EELS spectrum imaging, and electron diffraction. Dr. Kiely is recognized as a world leader in the area of catalyst material characterization.

Dr. Kiely is the Director of the Materials Characterization Facility at Lehigh and is also Director of the annual Lehigh Microscopy Schools. He has developed a particularly strong and productive international collaboration with researchers at the Cardiff Catalysis Institute in the UK. To date he has published more than 310 journal papers, 220 conference papers and has also given numerous invited presentations throughout Europe and the United States on his research work.