Archanjo Braulio S

Bráulio S. Archanjo received the Ph.D. degree in physics from the Federal University of Minas Gerais, in Brazil in 2008 when he joined the National Institute of Metrology, Quality and Technology of Brazil (Inmetro) as a research scientist. In 2016, Dr. Archanjo has developed a postdoctoral project in 3D EELS tomography in plasmonic nanoantennas in cooperation with the Nacional Center for Electron Microscopy (NCEM) at Berkeley Labs. His research interest includes: graphene and other 2D materials, soil carbon, nanoparticles, transmission and scanning electron microscopy, focused ion beam, helium ion microscopy, scanning probe microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, and X-ray diffraction.