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论文共 39 篇作者统计合作学者相似作者

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Reliability Testing and Virtual Prototyping for Embedded GaN Power Modules in Automotive Applications
Kshitij Anil Kolas,Alexander Otto, Rico Eichhorn, Jan Albrecht, Sven Rzepka,Maximilian Hepp
2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC)pp.1-8, (2024)
引用0浏览0EIWOS引用
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Health Condition Estimation for Discrete Power Electronic Devices under Package Failure
Zhonghai Lu,Alexander Otto
2024 IEEE INTERNATIONAL CONFERENCE ON PROGNOSTICS AND HEALTH MANAGEMENT, ICPHM 2024pp.336-347, (2024)
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Health Monitoring of IGBTs Using Machine Learning Techniques
Elena Blazhevska,Alexander Otto, Dino Hrvanovic,Guenter Prochart,Matthias K. Scharrer
IECONpp.1-7, (2023)
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A Data-driven Condition Monitoring Method to Predict the Remaining Useful Life of SiC Power Modules for Traction Inverters
Giovanni Di Nuzzo,Horst Lewitschnig, Marc Tuellmann,Sven Rzepka,Alexander Otto
2023 IEEE International Conference on Prognostics and Health Management (ICPHM)pp.312-319, (2023)
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RUL Estimation for Power Electronic Devices Based on LESIT Equation
Zhonghai Lu, Rui Shi,Alexander Otto,Jan Albrecht
2023 PROGNOSTICS AND HEALTH MANAGEMENT CONFERENCE, PHMpp.47-54, (2023)
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Study of Power Cycling Tests Superimposed with Passive Thermal Cycles on IGBT Modules
Alexander Otto,Xing Liu, Rico Eichhorn,Thomas Basler,Josef Lutz,Sven Rzepka
PCIM Europe 2023; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Managementpp.1-10, (2023)
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Failure Prediction and Analysis of an IGBT Module for Industrial Applications Subjected to Passive and Power Cycling
Rainer Dudek,Alexander Otto,Ralf Doering,Anu Mathew,Xing Liu,Sven Rzepka
International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systemspp.1-11, (2023)
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Building reliable FE simulation models for a better behavior prediction of power electronic systems
Heiner Moller,Rainer Dudek,Alexander Otto,Sven Rzepka
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm)pp.1-8, (2022)
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Modelling Thermal Fatigue in Power Electronics
Rainer Dudek,Ralf Doering,Anu Mathew,Alexander Otto,Sven Rzepka
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (2022)
引用3浏览0EIWOS引用
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作者统计

#Papers: 38

#Citation: 128

H-Index: 7

G-Index: 10

Sociability: 5

Diversity: 1

Activity: 1

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