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Research Interests

Papers共 154 篇Author StatisticsCo-AuthorSimilar Experts

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Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance
Y. Higashi,J. P. Bastos,A. Chasin,L. Breuil,A. Arreghini, S. Ramesh,S. Rachidi, Y. Jeong,G. Van den Bosch,M. Rosmeulen
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
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Gate Oxide Reliability: Upcoming Trends, Challenges, and Opportunities
B. Kaczer, R. Degraeve, J. Franco, T. Grasser,Ph. J. Roussel,E. Bury,P. Weckx,A. Chasin, S. Tyaginov,M. Vandemaele, A. Grill, B. O’Sullivan, J. Diaz Fortuny, P. Saraza Canflanca,M. Waltl, P. Rinaudo, Y. Zhao, E. Kao,R. Asanovski, E. Catapano, A. Beckers,A. Vici,B. Truijen, Y. Higashi,S. Clima, Y. Xiang, D. Sangani,L. Panarella,Q. Smets,T. Knobloch,D. Waldhör, B. Van Troeye, Y. Guo,A. Kruv, K. Viswakarma, M. Gonzalez, D. Linten
2024 IEEE Silicon Nanoelectronics Workshop (SNW)pp.3-4, (2024)
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Author Statistics

#Papers: 154

#Citation: 1579

H-Index: 22

G-Index: 35

Sociability: 6

Diversity: 2

Activity: 19

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