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Research Interests

Papers共 9 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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引用量
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期刊级别
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Selected High-Impact Journal Articles on Defects in Microelectronic Materials and Devices
Daniel Fleetwood
Defects in Microelectronic Materials and Devices (2008)
Cited3Views0Bibtex
3
0
Oxide Traps, Border Traps, and Interface Traps in SiO2
Daniel Fleetwood,Sokrates Pantelides,Ronald Schrimpf
Defects in Microelectronic Materials and Devices (2008)
Cited7Views0Bibtex
7
0
Investigation of Second-Harmonic Generation for SOI Wafer Metrology
Robert Pasternak,Bongim Jun,Ron Schrimpf,Daniel Fleetwood,Michael Alles, Robert Dolan, Robert Standley,Norman Tolk
ECS Meeting Abstractsno. 12 (2006): 577-577
Cited2Views0Bibtex
2
0
Single event effects
Xiaowei Zhu,Bharat Bhuva,Daniel Fleetwood,Ronald Schrimpf, Fritz Barnes,Lloyd W. Massengill,Ron Schrimpf,Dan Fleetwood,Tim Holman, Vinod Ambrose, Manjunath Bhat, Jim Chung, Heinrich Fisher,Ray Hokinson, Norm Leland, Phil Lin, David Moyer, Rob Mueller, Johann Nittmann, Llanda Richardson, Wendy Qin, Yuzhen Tang, Horst Wagner, Bjorn Zetterlund, Tina Zou,Yuanfu Zhao,Sungchul Lee, Scotter Ball,Hugh Barnaby,Younes Boulghassoul, Quping Hu, Daedra Lohr, Jason Lowe, Jim Felix, Yanfeng Li
semanticscholar（2002）
Cited11Views0Bibtex
11
0
Author Statistics

#Papers: 9

#Citation: 9

H-Index: 2

G-Index: 3

Sociability: 3

Diversity: 0

Activity: 0

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