Stanislas Baron - ASML Brion US, Santa Clara, CA USA

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Papers共 13 篇Author StatisticsCo-AuthorSimilar Experts

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Machine Learning Techniques For Opc Improvement At The Sub-5 Nm Node

Changsoo Kim,Seungjong Lee, Sangwoo Park,No-Young Chung,Jungmin Kim, Narae Bang, Sanghwa Lee,Sooryong Lee, Robert Boone, Pengcheng Li, Jiyoon Chang, Xinxin Zhou,

EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY XI (2020)

Cited3Views0Bibtex

Full-chip Application of Deep Learning SRAFs on DRAM Case Using Auto Pattern Selection

Kun-yuan Chen,Andy Lan,Richer Yang,Vincent Chen,Shulu Wang,Stella Zhang,Xiangru Xu,Andy Yang,Sam Liu,Xiaolong Shi,Angmar Li,Stephen Hsu,

Proceedings of SPIE（2019）

Cited3Views0Bibtex

Efficient full-chip SRAF placement using Machine Learning for best accuracy and improved consistency

Shibing Wang,Stanislas Baron, Nishrin Kachwala,Chidam Kallingal,Dezheng Sun,Vincent Shu,Weichun Fong,Zero Li,Ahmad Elsaid,Jin-Wei Gao,Jing Su,Jung-Hoon Ser,

Proceedings of SPIE (2018)

Cited11Views0Bibtex

The New Opc Method For Obtaining The Stability Of Mbaf Opc

Jookyoung Song,Jaeseung Choi,Chanha Park,Hyunjo Yang,Daekwon Kang, Minsu Oh, Manjae Park,James Moon, Jun Ye,Stanislas Baron

DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION FOR MANUFACTURABILITY XI（2017）

Cited0Views0Bibtex

Manufacturing Challenges for Curvilinear Masks

Chris Spence,Quan Zhang,Vincent Shu,Been-Der Chen,Stanislas Baron, Yasuko Saito,Masakazu Hamaji, Yasuaki Horima,Shuichiro Ohara

Photomask Technology (2017)

Cited11Views0Bibtex

Machine Learning Assisted Sraf Placement For Full Chip

Shibing Wang,Jing Su,Quan Zhang,Weichun Fong,Dezheng Sun,Stanislas Baron,Cuiping Zhang,Chenxi Lin,Been-Der Chen,Rafael C. Howell,Stephen D. Hsu, Larry Luo,

PHOTOMASK TECHNOLOGY 2017 (2017)

Cited9Views0Bibtex

Opc Care-Area Feedforwarding To Mpc

Brian Dillon, Yi-Hsing Peng,Masakazu Hamaji,Dai Tsunoda, Tomoyuki Muramatsu,Shuichiro Ohara, Yi Zou, Vincent Arnoux,Stanislas Baron, Xiaolong Zhang

PHOTOMASK TECHNOLOGY 2016 (2016)

Cited0Views0Bibtex

Robust And Automated Solution For Correcting Hotspots Locally Using Cost-Function Based Opc Solver

Carl Babcock, Dongok Yang,Sarah Mcgowan,Jun Ye,Bo Yan,Jianhong Qiu,Stanislas Baron,Taksh Pandey, Sanjay Kapasi,Chris Aquino

DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION FOR MANUFACTURABILITY VIII (2014)

Cited0Views0Bibtex

Process window enhancement using advanced RET techniques for 20nm contact layer

Yang Ping,Sarah Mcgowan,Ying Gong,Yee Mei Foong,Jian Liu,Jianhong Qiu,Vincent Shu,Bo Yan,Jun Ye,Pengcheng Li, Hui Zhou,Taksh Pandey,

Proceedings of SPIE（2014）

Cited10Views0Bibtex

3D Resist Profile Full Chip Verification and Hot Spot Disposition

Will Conley,Russell Dover,Bo Yan,Taksh Pandey,Jianhong Qiu,Stanislas Baron,Mu Feng, T Yun,Andre Leschok,Dongqing Zhang, Jens Hassmann,Yeemei Foong,

Proceedings of SPIE（2013）

Cited4Views0Bibtex

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