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个人简介
Damien Lambert (Senior Member, IEEE) received the Engineering degree from the École Supérieure d’Electronique de l’Ouest (E.S.E.O.), Angers, France, in 2002, the master’s degree in devices and microtechnologies from Rennes 2 University, Rennes, France, in 2002, and the Ph.D. degree from the Commissariat à l’Energie Atomique (CEA), Bruyères-le-Châtel, France, in collaboration with EADS and Montpellier II University, Montpellier, France, in 2006.
His main field of investigation was the sensitivity of integrated technologies to proton and neutron irradiations. After his Ph.D. graduation in 2006, he joined EADS Nuclétudes, Les Ulis, France, where he focused on electronic system reliability. Since 2019, he works at CEA as a Research Engineer. His main topics are the evaluation and simulations of radiation effects in electronics, photonics, and systems. He has authored or coauthored publications and presentations mainly at RADECS and NSREC (including two NSREC Outstanding Conference Paper).
Dr. Lambert is a member of the Geant4 international collaboration.
研究兴趣
论文共 44 篇作者统计合作学者相似作者
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Julien Parize,Thomas Jarrin, Antoine Fees,Damien Lambert,Antoine Jay, Valentin Morin,Anne Hemeryck,Nicolas Richard
IEEE TRANSACTIONS ON NUCLEAR SCIENCEno. 8 (2024): 1461-1469
IEEE TRANSACTIONS ON NUCLEAR SCIENCEno. 4 (2024): 522-534
IEEE transactions on nuclear scienceno. 4 (2023): 575-582
Microelectronics Reliability (2023)
IEEE SENSORS JOURNALno. 22 (2023): 27300-27306
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作者统计
#Papers: 43
#Citation: 460
H-Index: 12
G-Index: 21
Sociability: 5
Diversity: 1
Activity: 16
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