Jean-Luc Autran is Distinguished Professor of Physics and Electrical Engineering with Aix-Marseille University, Marseille, France. He is currently Deputy Director of the Institute for Materials Microelectronics and Nanoscience of Provence (IM2NP) Laboratory (UMR CNRS 7334) and the Principal Investigator of the Altitude SEE Test European Platform (ASTEP) platform dedicated to the characterization of electronic circuits in the terrestrial natural radiation environment. His research interests include the characterization, modeling, and numerical simulation of Single Event Effects (SEE) in advanced CMOS technologies and particularly the physics of Soft Errors. He is the author or a coauthor of more than 300 papers published in international journals and conference proceedings, 20 invited conferences, and 13 book chapters.