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Direct Measurement of 2DEG States in Shallow Si:Sb Δ-Layers

Frode S. Strand,Simon P. Cooil, Quinn T. Campbell, John J. Flounders,Håkon I. Røst, Anna Cecilie Åsland, Alv Johan Skarpeid, Marte P. Stalsberg, Jinbang Hu, Johannes Bakkelund, Victoria Bjelland, Alexei B. Preobrajenski,Zheshen Li,Marco Bianchi,Jill A. Miwa,Justin W. Wells

arxiv(2024)

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